Description
SUNKINGDOM FULL FIELD AUTO-PROJECTION PERIMETER, MODEL:850A(Standard) with Built In Computer Screen & Touch Screen w/o Printer ( equivalent Auto Perimeter of Humphrey HFA-840)
Technical Specification:-
| DB value range | 0-51 db |
| Stimulus size | Goldmann III |
| Stimulus intensity | 0-100000asb |
| Projective plane | Aspherical surface |
| Test mode | static and Goldmann kinetic test |
| Stimulus colors | white |
| Stimulus brightness control | change optical progressive lens to control projection brightness |
| Max measurement range | 90◦ |
| Testing distance | 300mm |
| Pupil measurement | Auto pupil measurement |
| Background illu | white 31.5 asb |
| Background illu. Color | white |
| Patient react time | System default & Auto-adaption |
| Eye fixation monitoring system | Heijl/Krakau blind spot monitor; video eye monitor; head tracking ; Gaze tracking |
| light brightness initialization calibration | measuring projection light brightness &calibrating automatically. |
| Light resource | Halogen lamp |
Excellent Test Strategy
|
Kinetic Test:
1. Kinetic test mode: Standard program, Static points, Scotoma map, Blind spot map, Custom Programs 2. Stimulus speed: 1 ̴ 9°/S adjustable |
| Static Test:
1. Threshold test program: Macula, 10-2,24-2,30-2.60-4,Nasal step 2. Screening test program: C-40, C-64, C-76, C-80, C-88, P-60, Nasal step, FF-81, FF-120, FF-135, FF-246, FF-102 3. Specialty test program: Esterman monocular, Esterman binocular, Superior 36, Superior 64 4. User-defined test: Available for storage 5. Test strategy: Auto threshold test(40% testing duration shortened compared with Full threshold test, without decreasing the test accuracy), Full threshold, Auto threshold fast 6. Screening test strategy: Zone 2, Zone 3, Age corrected screening test, Single intensity, Threshold related test. 7. Analysis Software: Creditability analysis, Single field analysis, Multi fields analysis, Glaucoma Hemifield Test, Glaucoma progression analysis 8. Report Plots: DB Value, Grayscale, Total deviation, Total probability, Pattern deviation, Pattern probability |
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